| 1. | Secondary ion mass spectrometry
二次离子质谱法 |
| 2. | Secondary ion mass spectrometer
二次离子质谱计 |
| 3. | Secondary ion spectroscopy
二次离子谱法 |
| 4. | Secondary ion spectrometer
二次离子谱仪 |
| 5. | Secondary ion background
二次离子本底 |
| 6. | The instrument directs the secondary ions to a mass spectrometer that identifies their compositions
仪器会将次级离子导向质谱仪，以?定其组成。 |
| 7. | Surface chemical analysis - secondary ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials
表面化学分析.次级离子质谱法.利用均匀掺杂材料测定硅中硼原子浓度 |
| 8. | The conductivity , components and profile of the n - type diamond were characterized by hall effect , secondary ion mass spectrometry ( sims ) and the scanning electron microscopy ( sem )
通过hall效应，二次离子质谱( sims )及扫描电子显微镜( sem )等多种技术手段，对n -型金刚石薄膜的导电特性、成分和薄膜的形貌等方面进行了表征。 |
| 9. | The films were characterized by diffraction , x - ray photoelectron spectroscopy , scanning electron microscopy , secondary ion mass spectrometer to research their hfa phase , morphology , fluorine content and fluorine distribution
在实验中运用xrd 、 xps 、 sem 、 sims 、 sem等技术对薄膜的相组成、表面形貌、氟含量以及氟分布进行了分析和研究。 |
| 10. | In most recent studies , researchers have analyzed aluminum - rich minerals such as anorthite and hibonite using an ion microprobe , which bombards a sample with a focused ion beam to release secondary ions from the sample ' s surface
在最新的研究中，科学家使用离子微探针来分析钙长石、黑铝钛钙石等富含铝的矿物，以聚焦的离子束撞击样本，使样本表面释出次级离子。 |
